Method of integral equations in the spectral domain for the analysis of plane defects of a substrate
Crossref DOI link: https://doi.org/10.1134/S0012266114090055
Published Online: 2014-10-11
Published Print: 2014-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Eremin, Yu. A.
Lopushenko, V. V.
Text and Data Mining valid from 2014-09-01