The effect of the hydrofluoric acid etchant–silicon system anisotropy on the shape of pores formed upon electrochemical etching of silicon
Crossref DOI link: https://doi.org/10.1134/S0012500815090025
Published Online: 2015-10-09
Published Print: 2015-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Abramova, E. N.
Khort, A. M.
Syrov, Yu. V.
Yakovenko, A. G.
Shvets, V. I.
Text and Data Mining valid from 2015-09-01
Version of Record valid from 2015-09-01
Article History
Received: 17 April 2015
First Online: 9 October 2015