Crossmark

Spectral ellipsometry study of thin films grown on GaAs by chemically stimulated thermal oxidation

Published Online: 2014-08-05

Published Print: 2014-09

Authors

Kostryukov, V. F.

Mittova, I. Ya.

Shvets, V. A.

Tomina, E. V.

Sladkopevtsev, B. V.

Tret’yakov, N. N.
License Information

Text and Data Mining valid from 2014-08-05

Version of Record valid from 2014-08-05
More Information

Article History

Received: 25 February 2014

First Online: 5 August 2014

Document is current