Modeling of the influence of defects on the electronic structure of silicon nanoclusters
Crossref DOI link: https://doi.org/10.1134/S0020168515080166
Published Online: 2015-08-01
Published Print: 2015-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sokolenko, E. V.
Text and Data Mining valid from 2015-08-01