Measurement of lifetime of nonequilibrium charge carriers in single-crystal silicon
Crossref DOI link: https://doi.org/10.1134/S0020168515150029
Published Online: 2016-04-26
Published Print: 2015-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Anfimov, I. M.
Kobeleva, S. P.
Shchemerov, I. V.
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