Electron Probe X-Ray Analysis of Nanofilms at Off-Normal Incidence of the Electron Beam
Crossref DOI link: https://doi.org/10.1134/S0020168518140066
Published Online: 2019-01-17
Published Print: 2018-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Darznek, S. A.
Mityukhlyaev, V. B.
Todua, P. A.
Filippov, M. N.
Text and Data Mining valid from 2018-12-01
Article History
Received: 9 February 2017
First Online: 17 January 2019