Defect Structure and Photogenerated Carrier Loss Processes in Cu1 –x(In0.7Ga0.3)Se2 (0 ≤ x ≤ 0.30) Chalcopyrite Solid Solutions
Crossref DOI link: https://doi.org/10.1134/S0020168519070057
Published Online: 2019-07-23
Published Print: 2019-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Gapanovich, M. V.
Odin, I. N.
Rabenok, E. V.
Orishina, P. S.
Novikov, G. F.
Text and Data Mining valid from 2019-07-01
Version of Record valid from 2019-07-01
Article History
Received: 26 November 2018
Revised: 21 January 2019
Accepted: 10 February 2019
First Online: 23 July 2019