Application specific integrated circuits in radiation measuring systems (Review, Part 2)
Crossref DOI link: https://doi.org/10.1134/S0020441216020305
Published Online: 2016-05-13
Published Print: 2016-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Basiladze, S. G.
Text and Data Mining valid from 2016-03-01
Version of Record valid from 2016-03-01
Article History
Received: 7 July 2015
First Online: 13 May 2016