A Study of the Radiation Hardness of Si and SiC Detectors Using a Xe Ion Beam
Crossref DOI link: https://doi.org/10.1134/S0020441218060192
Published Online: 2018-12-05
Published Print: 2018-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Hrubčín, L.
Gurov, Yu. B.
Zaťko, B.
Ivanov, O. M.
Mitrofanov, S. V.
Rozov, S. V.
Sandukovsky, V. G.
Semin, V. A.
Skuratov, V. A.
Text and Data Mining valid from 2018-11-01
Article History
Received: 5 December 2017
First Online: 5 December 2018