The Total-Reflection X-Ray Fluorescence Yield Formed by a Waveguide Resonator under Conditions of Ion Beam Excitation
Crossref DOI link: https://doi.org/10.1134/S0020441219050014
Published Online: 2019-09-30
Published Print: 2019-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Afanasiev, M. S.
Egorov, V. K.
Egorov, E. V.
Kuharskaya, N. F.
Nabiev, A. E.
Naryshkina, V. G.
Text and Data Mining valid from 2019-09-01
Version of Record valid from 2019-09-01
Article History
Received: 1 March 2019
Revised: 1 March 2019
Accepted: 14 March 2019
First Online: 30 September 2019