A Low Temperature Cell for High Frequency Electrophysical Measurements of Semiconductor Devices
Crossref DOI link: https://doi.org/10.1134/S0020441221050146
Published Online: 2021-11-23
Published Print: 2021-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Aimaganbetov, K. P.
Aldiyarov, A. U.
Zhantuarov, S. R.
Almasov, N. Zh.
Terukov, E. I.
Tokmoldin, N. S.
Text and Data Mining valid from 2021-11-01
Version of Record valid from 2021-11-01
Article History
Received: 26 January 2021
Revised: 12 April 2021
Accepted: 28 April 2021
First Online: 23 November 2021