Transmission Line Pulse Setup for Electrostatic Discharge Robustness Testing of the Semiconductor Devices
Crossref DOI link: https://doi.org/10.1134/S0020441224700453
Published Online: 2024-07-08
Published Print: 2024-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kuznetsov, V. V.
Andreev, V. V.
Text and Data Mining valid from 2024-04-01
Version of Record valid from 2024-04-01
Article History
Received: 15 May 2023
Revised: 24 May 2023
Accepted: 2 July 2023
First Online: 8 July 2024
CONFLICT OF INTEREST
: The authors of this work declare that they have no conflicts of interest.