Investigations of local electronic transport in InAs nanowires by scanning gate microscopy at liquid helium temperatures
Crossref DOI link: https://doi.org/10.1134/S0021364014130128
Published Online: 2014-09-13
Published Print: 2014-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Zhukov, A. A.
Volk, Ch.
Winden, A.
Hardtdegen, H.
Schäpers, Th.
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