Si–Si bond as a deep trap for electrons and holes in silicon nitride
Crossref DOI link: https://doi.org/10.1134/S0021364016030085
Published Online: 2016-05-12
Published Print: 2016-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Karpushin, A. A.
Sorokin, A. N.
Gritsenko, V. A.
Text and Data Mining valid from 2016-02-01
