Two-photon confocal microscopy as a tool for nonequilibrium charge-carrier lifetime tomography in semiconductor materials
Crossref DOI link: https://doi.org/10.1134/S0021364016230089
Published Online: 2017-02-28
Published Print: 2016-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kalinushkin, V. P.
Uvarov, O. V.
License valid from 2016-12-01
