X-ray reflectivity and photoelectron spectroscopy of superlattices with silicon nanocrystals
Crossref DOI link: https://doi.org/10.1134/S0021364017200140
Published Online: 2017-12-23
Published Print: 2017-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Zhigunov, D. M.
Kamenskikh, I. A.
Lebedev, A. M.
Chumakov, R. G.
Logachev, Yu. A.
Yakunin, S. N.
Kashkarov, P. K.
License valid from 2017-10-01