Physical Foundations of an Application of Scanning Probe with Spin Centers in SiC for the Submicron Quantum Probing of Magnetic Fields and Temperatures
Crossref DOI link: https://doi.org/10.1134/S0021364018210063
Published Online: 2019-01-03
Published Print: 2018-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Anisimov, A. N.
Soltamov, V. A.
Breev, I. D.
Khalisov, M. M.
Babunts, R. A.
Ankudinov, A. V.
Baranov, P. G.
Text and Data Mining valid from 2018-11-01
Article History
Received: 31 August 2018
Accepted: 26 September 2018
First Online: 3 January 2019