Effect of the Semiconductor Spacer on Positive Exchange Bias in the CoNi/Si/FeNi Three-Layer Structure
Crossref DOI link: https://doi.org/10.1134/S0021364019050126
Published Online: 2019-05-17
Published Print: 2019-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Patrin, G. S.
Turpanov, I. A.
Yushkov, V. I.
Kobyakov, A. V.
Patrin, K. G.
Yurkin, G. Yu.
Zhivaya, Ya. A.
Text and Data Mining valid from 2019-03-01
Version of Record valid from 2019-03-01
Article History
Received: 21 September 2018
Revised: 14 December 2018
Accepted: 25 December 2018
First Online: 17 May 2019