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Microstructural Characterization of V-Defects in InGaN/GaN Multiquantum Wells

Crossref DOI link: https://doi.org/10.1134/S0021364020050021

Published Online: 2020-05-11

Published Print: 2020-03

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Wang, H.

Jin, G.

Tan, Q.
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Text and Data Mining valid from 2020-03-01

Version of Record valid from 2020-03-01
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Article History

Received: 27 December 2019

Revised: 2 February 2020

Accepted: 2 February 2020

First Online: 11 May 2020