Unusual X-Shaped Defects in the Silicon Single Crystal Subjected to Four-Point Bending
Crossref DOI link: https://doi.org/10.1134/S0021364021030115
Published Online: 2021-04-28
Published Print: 2021-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Zolotov, D. A.
Asadchikov, V. E.
Buzmakov, A. V.
Dyachkova, I. G.
Suvorov, E. V.
Text and Data Mining valid from 2021-02-01
Version of Record valid from 2021-02-01
Article History
Received: 30 November 2020
Revised: 14 December 2020
Accepted: 24 December 2020
First Online: 28 April 2021