X-ray and Auger microprobe studies of vanadium-doped layered chromium-copper disulfide crystals
Crossref DOI link: https://doi.org/10.1134/S0022476614050084
Published Online: 2014-12-03
Published Print: 2014-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sokolov, V. V.
Korotaev, E. V.
Peregudova, N. N.
Kuchumov, B. M.
Prozorov, P. A.
Topyakova, M. V.
Mazalov, L. N.
Dikov, Yu. P.
Buleev, M. I.
Pichugin, A. Yu.
Filatova, I. Yu.
Berdinskii, A. S.
Velichko, A. A.
Text and Data Mining valid from 2014-09-01