An XPS and TPD study of gold oxide films obtained by exposure to RF-activated oxygen
Crossref DOI link: https://doi.org/10.1134/S0022476615030245
Published Online: 2015-07-25
Published Print: 2015-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Stadnichenko, A. I.
Koshcheev, S. V.
Boronin, A. I.
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