Molecular dynamics simulations of defect formation in thin graphite films using the density functional tight-binding method
Crossref DOI link: https://doi.org/10.1134/S0022476616040260
Published Online: 2016-09-29
Published Print: 2016-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Shein, I. R.
Kuznetsov, M. V.
Enyashin, A. N.
License valid from 2016-07-01