X-Ray Certification of Si, Ge, LaB6, and InSb Single Crystals
Crossref DOI link: https://doi.org/10.1134/S0022476625070157
Published Online: 2025-08-05
Published Print: 2025-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Serebrennikova, P. S.
Gromilov, S. A.
Text and Data Mining valid from 2025-07-01
Version of Record valid from 2025-07-01
Article History
Received: 8 April 2025
Revised: 23 April 2025
Accepted: 23 April 2025
First Online: 5 August 2025
Conflict of Interests
: The authors of this work declare that they have no conflicts of interest.