Analysis of scattering properties of nonaxiosymmetric substrate defects by the discrete-source method
Crossref DOI link: https://doi.org/10.1134/S0030400X14110071
Published Online: 2014-12-04
Published Print: 2014-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Grishina, N. V.
Eremin, Yu. A.
Sveshnikov, A. G.
Text and Data Mining valid from 2014-12-01