Raman scattering for lead telluride-based thin film structures
Crossref DOI link: https://doi.org/10.1134/S0030400X14110241
Published Online: 2014-11-14
Published Print: 2014-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Zimin, S. P.
Gorlachev, E. S.
Baranov, A. V.
Cherevkov, S. A.
Abramof, E.
Rappl, P. H. O.
Text and Data Mining valid from 2014-11-01