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A Structural and Ellipsometric Investigation of Thin Gallium Oxide Layers Deposited on Si by Means of Laser Deposition

Crossref DOI link: https://doi.org/10.1134/S0030400X17120153

Published Online: 2018-02-27

Published Print: 2017-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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