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Determining the Compositional Profile of HgTe/CdxHg1 – xTe Quantum Wells by Single-Wavelength Ellipsometry

Published Online: 2019-09-18

Published Print: 2019-08

Authors

Shvets, V. A.

Mikhailov, N. N.

Ikusov, D. G.

Uzhakov, I. N.

Dvoretskii, S. A.
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Text and Data Mining valid from 2019-08-01

Version of Record valid from 2019-08-01
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Article History

Received: 11 December 2018

Revised: 11 February 2019

Accepted: 22 February 2019

First Online: 18 September 2019

CONFLICT OF INTEREST

: The authors declare that they have no conflict of interest.

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