Influence of High-Temperature Annealing of the Textured Metal Ni–W Substrate on the Structural Properties of Seed Layer in HTS 2G tapes
Crossref DOI link: https://doi.org/10.1134/S0031918X1803002X
Published Online: 2018-04-05
Published Print: 2018-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Chernykh, M. Y.
Krylova, T. S.
Kulikov, I. V.
Chernykh, I. A.
Zanaveskin, M. L.
Text and Data Mining valid from 2018-03-01
Article History
Received: 29 June 2017
Accepted: 24 August 2017
First Online: 5 April 2018