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Structural and electronic properties of XY-doped (AlN, AlP, GaN, GaP) C58 fullerenes: a DFT study

Crossref DOI link: https://doi.org/10.1134/S0036023617080034

Published Online: 2017-08-30

Published Print: 2017-08

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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