The Determining Role of the (HF2)– Ion in the Formation of Pores in Silicon in Its Electrochemical Etching with Hydrofluoric Acid Solutions
Crossref DOI link: https://doi.org/10.1134/S0036023618090024
Published Online: 2018-09-28
Published Print: 2018-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Abramova, E. N.
Khort, A. M.
Yakovenko, A. G.
Slipchenko, E. A.
Kornilova, D. S.
Tsygankova, M. V.
Shvets, V. I.
Text and Data Mining valid from 2018-09-01
Version of Record valid from 2018-09-01
Article History
Received: 1 June 2017
First Online: 28 September 2018