Crossmark

State of Stress in the Near-Contact Region of a Semiconductor during Metallization Track Electrodegradation

Published Online: 2020-12-30

Published Print: 2020-12

Authors

Skvortsov, A. A.

Zuev, S. M.

Koryachko, M. V.

Voloshinov, E. B.
License Information

Text and Data Mining valid from 2020-12-01

Version of Record valid from 2020-12-01
More Information

Article History

Received: 21 May 2019

Revised: 10 July 2019

Accepted: 17 July 2019

First Online: 30 December 2020

Document is current