Direct and inverse problems of studying the properties of multilayer nanostructures based on a two-dimensional model of X-ray reflection and scattering
Crossref DOI link: https://doi.org/10.1134/S0965542514060104
Published Online: 2014-06-12
Published Print: 2014-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Khachaturov, R. V.
Text and Data Mining valid from 2014-06-01