Atomic force microscopy on surfaces with a developed profile
Crossref DOI link: https://doi.org/10.1134/S1027451014030161
Published Online: 2014-08-07
Published Print: 2014-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Temiryazev, A. G.
Borisov, V. I.
Saunin, S. A.
Text and Data Mining valid from 2014-07-01
