Backscattered electron imaging of micro- and nanostructures: 1. Method of analysis
Crossref DOI link: https://doi.org/10.1134/S1027451014040296
Published Online: 2014-08-07
Published Print: 2014-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Novikov, Yu. A.
Text and Data Mining valid from 2014-07-01
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Article History
Received: 7 July 2013
First Online: 7 August 2014