Surface transition-layer model used to study the fine structure of X-ray reflection spectra
Crossref DOI link: https://doi.org/10.1134/S1027451014060354
Published Online: 2014-12-05
Published Print: 2014-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Mazuritskiy, M. I.
Novakovich, A. A.
Text and Data Mining valid from 2014-11-01