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Study of thermal effects on the structure of thin-film borosilicate coatings by ellipsometry, and X-ray diffraction

Crossref DOI link: https://doi.org/10.1134/S1027451015040163

Published Online: 2015-10-16

Published Print: 2015-09

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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