Synergetics of catastrophic failures of semiconductor devices under high-energy ion irradiation
Crossref DOI link: https://doi.org/10.1134/S1027451016020324
Published Online: 2016-05-15
Published Print: 2016-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Oksengendler, B. L.
Dzhurabekova, F. G.
Maksimov, S. E.
Turaev, N. Yu.
Text and Data Mining valid from 2016-03-01
Version of Record valid from 2016-03-01
Article History
Received: 20 July 2015
First Online: 15 May 2016