Analysis of the composition of graphene-oxide films using a backscattered H+ ion beam
Crossref DOI link: https://doi.org/10.1134/S1027451016030290
Published Online: 2016-06-03
Published Print: 2016-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Mokrushin, A. D.
Egorov, E. V.
Smirnov, V. A.
Text and Data Mining valid from 2016-05-01
Version of Record valid from 2016-05-01
Article History
Received: 29 October 2015
First Online: 3 June 2016