Experimental determination of the energy dependence of electron inelastic mean free path in silicon oxide and silicon nitride
Crossref DOI link: https://doi.org/10.1134/S1027451016040066
Published Online: 2016-08-13
Published Print: 2016-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Garmash, V. I.
Djuzhev, N. A.
Kirilenko, E. P.
Makhiboroda, M. A.
Migunov, D. M.
License valid from 2016-07-01