Analysis of the oscillation intensity of RHEED specular reflection during the MBE growth of CaF2/Si/CaF2 structures
Crossref DOI link: https://doi.org/10.1134/S1027451016050165
Published Online: 2016-10-20
Published Print: 2016-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Velichko, A. A.
Ilyushin, V. A.
Krupin, A. U.
Gavrilenko, V. A.
Filimonova, N. I.
License valid from 2016-09-01