Document is current

Any future updates will be listed below

High resolution X-ray studies of porous PbTe layers on silicon substrates

Crossref DOI link: https://doi.org/10.1134/S1027451017030107

Published Online: 2017-06-15

Published Print: 2017-05

Update policy: https://doi.org/10.1007/springer_crossmark_policy

About CrossMark