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On the possibility of using the Galerkin projection method to model the spatial distribution of minority charge carriers generated by an electron probe in a semiconductor

Crossref DOI link: https://doi.org/10.1134/S1027451017050147

Published Online: 2017-10-04

Published Print: 2017-09

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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