Analysis of the Three-Dimensional Model of Diffusion of Minority Charge Carriers Generated by an Electron Probe in a Heterogeneous Semiconductor Material by Means of Projection Methods
Crossref DOI link: https://doi.org/10.1134/S1027451018010160
Published Online: 2018-04-02
Published Print: 2018-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Seregina, E. V.
Stepovich, M. A.
Makarenkov, A. M.
Text and Data Mining valid from 2018-01-01
Article History
Received: 15 June 2017
First Online: 2 April 2018