Investigation of the Effect of Electron-Beam Irradiation on the Defect Structure of Laterally Overgrown GaN Films via the Induced-Current and Cathodoluminescence Methods
Crossref DOI link: https://doi.org/10.1134/S1027451018050348
Published Online: 2018-10-09
Published Print: 2018-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Vergeles, P. S.
Yakimov, E. B.
Text and Data Mining valid from 2018-09-01
Article History
Received: 14 January 2018
First Online: 9 October 2018