Determination of the Thickness of Nanofilms Using X-Ray Photoelectron Spectroscopy
Crossref DOI link: https://doi.org/10.1134/S1027451018050580
Published Online: 2019-03-05
Published Print: 2018-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kaplya, P. S.
Efremenko, D. S.
Afanas’ev, V. P.
Text and Data Mining valid from 2018-11-01
Article History
Received: 25 January 2018
First Online: 5 March 2019