Near-Field Defects Imaging in Thin DLC Coatings Using High-Frequency Scanning Acoustic Microscopy
Crossref DOI link: https://doi.org/10.1134/S1027451018050737
Published Online: 2019-03-05
Published Print: 2018-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Zinin, P. V.
Kutuza, I. B.
Titov, S. A.
Text and Data Mining valid from 2018-11-01
Article History
Received: 14 November 2018
First Online: 5 March 2019