Atomic Force Microscopy for Studies of Molecular Layering Products
Crossref DOI link: https://doi.org/10.1134/S102745101901018X
Published Online: 2019-03-05
Published Print: 2018-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sosnov, E. A.
Kochetkova, A. S.
Text and Data Mining valid from 2018-11-01
Version of Record valid from 2018-11-01
Article History
Received: 5 April 2018
First Online: 5 March 2019