Estimating the Crystallographic Structure of AlGaN/GaN Heterostructure Buffer Layers Using Symmetric and Asymmetric X-ray Schemes
Crossref DOI link: https://doi.org/10.1134/S1027451019040104
Published Online: 2019-08-28
Published Print: 2019-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lutzau, A. V.
Temper, E. M.
Enisherlova, K. L.
Text and Data Mining valid from 2019-07-01
Version of Record valid from 2019-07-01
Article History
Received: 28 January 2018
Revised: 15 March 2018
Accepted: 20 March 2018
First Online: 28 August 2019