Computer Analysis of AFM Images of a Silicon Surface Implanted with Zinc Ions and Oxidized at Elevated Temperatures
Crossref DOI link: https://doi.org/10.1134/S1027451019040360
Published Online: 2019-08-28
Published Print: 2019-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sokolov, V. N.
Razgulina, O. V.
Privezentsev, V. V.
Ksenich, S. V.
Text and Data Mining valid from 2019-07-01
Version of Record valid from 2019-07-01
Article History
Received: 18 December 2018
Revised: 23 January 2019
Accepted: 23 January 2019
First Online: 28 August 2019